Accelerated Testing

出版者:Wiley-Interscience

作者:Wayne B. Nelson

页数:624

出版时间:2004-09-21

价格:USD 111.50

装帧:Paperback

isbn号码:9780471697367

图书标签:测试可靠性微电子

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This practical resource presents modern, statistical methods for accelerated testing including test models, analyses of data, and plans for testing. Each topic is self-contained for easy reference. Coverage is broad and detailed enough to serve as a text or reference. This handy book features real test examples along with data analyses, computer programs, and references to the literature.