Reliability, Yield, and Stress Burn-In

出版者:Springer

作者:Way Kuo

页数:424

出版时间:1998-01-31

价格:USD 269.00

装帧:Hardcover

isbn号码:9780792381075

具体描述

Reliability, Yield, and Stress Burn-In explains reliability issues in Microelectronics Systems Manufacturing and Software Development with an emphasis on evolving manufacturing technology for the semiconductor industry. Since most microelectronics components have an infant mortality period of about one year under ordinary operating conditions, and many modern systems, such as PCs, are heavily used in the first few years, the reliability problem in the infant mortality period becomes extremely important. Burn-in is an accelerated screening procedure that eliminates infant mortalities early on in the shop before shipping out the products to the customers. This book will also help readers to analyze systems that exhibit high failure rate during a long infant mortality period. Reliability, Yield, and Stress Burn-In presents ways to systematically analyze burn-in policy at the component, sub-system, and system levels. Various statistical methods are addressed including parametric, nonparametric, and Bayesian approaches. Many case studies are introduced in combination with the developed theories. Included in the book is an introduction to software reliability. Reliability, Yield, and Stress Burn-In will help manufacturers and system designers to understand and to design a more reliable product given constraints specified by the users and designers. An understanding of the infant mortality period will solve many reliability problems, including those faced in the semiconductor industry and software industry.