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Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2025 pdf epub mobi 电子书

Defect-oriented Testing for Nano-metric CMOS VLSI Circuits

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发表于2025-03-10

Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2025 pdf epub mobi 电子书

Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2025 pdf epub mobi 电子书

Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2025 pdf epub mobi 电子书

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出版者:Springer Verlag

作者:Sachdev, Manoj/ de Gyvez, Jose Pineda

出品人:

页数:352

译者:

出版时间:2007-6

价格:$ 213.57

装帧:HRD

isbn号码:9780387465463

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Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2025 pdf epub mobi 电子书图书描述

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2025 pdf epub mobi 电子书

Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2025 pdf epub mobi 电子书

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