Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2024 pdf epub mobi 電子書 下載


Defect-oriented Testing for Nano-metric CMOS VLSI Circuits

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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2024 pdf epub mobi 電子書 下載

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Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2024 pdf epub mobi 電子書 下載

Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2024 pdf epub mobi 電子書 下載

Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2024 pdf epub mobi 電子書 下載



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出版者:Springer Verlag
作者:Sachdev, Manoj/ de Gyvez, Jose Pineda
出品人:
頁數:352
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出版時間:2007-6
價格:$ 213.57
裝幀:HRD
isbn號碼:9780387465463
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Defect-oriented Testing for Nano-metric CMOS VLSI Circuits 2024 pdf epub mobi 電子書 下載
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