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The worldwide semiconductor community faces increasingly difficult challenges in the era of silicon nanotechnology and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continuing the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The book also covers emerging nano-devices and the corresponding metrology challenges that arise.
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發表於2025-01-19
Characterization and Metrology for ULSI Technology 2005 2025 pdf epub mobi 電子書 下載
Characterization and Metrology for ULSI Technology 2005 2025 pdf epub mobi 電子書 下載
Characterization and Metrology for ULSI Technology 2005 2025 pdf epub mobi 電子書 下載
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出版者:American Inst. of Physics
作者:Seiler, D. G.; Seiler, David G.; Diebold, Alain C.
出品人:
頁數:667
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出版時間:2005-9-29
價格:USD 245.00
裝幀:Hardcover
isbn號碼:9780735402775
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Characterization and Metrology for ULSI Technology 2005 2025 pdf epub mobi 電子書 下載
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Characterization and Metrology for ULSI Technology 2005 2025 pdf epub mobi 電子書 下載