Scanning Microscopy for Nanotechnology

出版者:Springer Verlag

作者:Zhou, Weilie (EDT)/ Wang, Zhong Lin (EDT)

页数:552

出版时间:2006-11

价格:$ 224.87

装帧:HRD

isbn号码:9780387333250

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.